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1

[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Transistor matching in analog CMOS applications

Pelgrom, M.J.M., Tuinhout, H.P., Vertregt, M.

Year:

1998

Language:

english

File:

PDF, 415 KB

english, 1998

2

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Impact of interface states on MOS transistor mismatch

Andricciola, P., Tuinhout, H. P., De Vries, B., Wils, N. A. H., Scholten, A. J., Klaassen, D. B. M.

Year:

2009

Language:

english

File:

PDF, 995 KB

english, 2009

3

[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Characterization of matching variability and low-frequency noise for mixed-signal technologies

Year:

2013

File:

PDF, 4.11 MB

2013

4

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - Very low frequency noise characterization of semiconductor devices using DC parameter analyzers

Tuinhout, Hans, Zegers-van Duijnhoven, Adrie, Heringa, Anco

Year:

2012

Language:

english

File:

PDF, 1.18 MB

english, 2012

5

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

Tuinhout, H.P., Montree, A.H., Schmitz, J., Stolk, P.A.

Year:

1997

Language:

english

File:

PDF, 398 KB

english, 1997

6

[IEEE 2019 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2019.12.7-2019.12.11)] 2019 IEEE International Electron Devices Meeting (IEDM) - Record high-performance RF devices in an advanced FDSOI process enabling integrated Watt-level power amplifiers for WiFi and 5G applications

Dinh, T. V., Raucoules-aime, M., Toso, S. Dal, Ghidini, C., Hovens, B. W. C., Vroubel, M., Brunets, I., Tuinhout, H. P., Tiemeijer, L.T.F., Wils, N., Sasse, G. T., Grudowski, P.

Year:

2019

File:

PDF, 7.03 MB

2019

7

RF Bulk Acoustic Wave Resonators and Filters

H.P. Loebl, C. Metzmacher, R.F. Milsom, P. Lok, F. van Straten, A. Tuinhout

Journal:

Journal of Electroceramics

Year:

2004

Language:

english

File:

PDF, 599 KB

english, 2004

8

Parametric Mismatch Characterization for Mixed-Signal Technologies

Tuinhout, H., Wils, N., Andricciola, P.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2010

Language:

english

File:

PDF, 1.63 MB

english, 2010

9

Comparison of soft-breakdown triggers for large-area capacitors under constant voltage stress

Schmitz, J., Tuinhout, H.P., Kretschmann, H.J., Woerlee, P.H.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2001

Language:

english

File:

PDF, 176 KB

english, 2001

10

Foot Build Registration System (FBRS) to evaluate foot posture: a reliability study with healthy subjects and patients with Charcot-Marie-Tooth disease

M. Tuinhout, P.G. Anderson, J.W.K. Louwerens

Journal:

Foot and Ankle Surgery

Year:

2009

Language:

english

File:

PDF, 274 KB

english, 2009

11

Analog circuits in ultra-deep-submicron CMOS

Annema, A.-J., Nauta, B., van Langevelde, R., Tuinhout, H.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2005

Language:

english

File:

PDF, 652 KB

english, 2005

12

[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Impact of Source/drain Implants on Threshold Voltage Matching in Deep Sub-micron CMOS Technologies

Dubois, J., Knol, J., Bolt, M., Tuinhout, H., Schmitz, J., Stolk, P.

Year:

2002

Language:

english

File:

PDF, 145 KB

english, 2002

13

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Mismatch sources in LDMOS devices

Andricciola, Pietro, Tuinhout, Hans

Year:

2010

Language:

english

File:

PDF, 330 KB

english, 2010

14

[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Parametric mismatch characterization for mixed-signal technologies

Tuinhout, Hans, Wils, Nicole

Year:

2009

Language:

english

File:

PDF, 763 KB

english, 2009

15

The Temperature Dependence of Mismatch in Deep-Submicrometer Bulk MOSFETs

Andricciola, P., Tuinhout, H.P.

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 333 KB

english, 2009

16

[IEEE 1994 IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (22-25 March 1994)] Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures - Design of matching test structures [IC components]

Year:

1994

Language:

english

File:

PDF, 650 KB

english, 1994

17

Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits

Pineda de Gyvez, J., Tuinhout, H.P.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2004

Language:

english

File:

PDF, 649 KB

english, 2004

18

[IEEE Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Santa Barbara, CA, USA (Oct. 9-11, 2005)] Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. - Identification and analysis of a new BJT parametric mismatch phenomenon

Wils, N., Tuinhout, H., Ewert, T., van Berkum, J., Kaiser, M., Weemaes, R.

Year:

2005

Language:

english

File:

PDF, 2.47 MB

english, 2005

19

Can diagnostic injections predict the outcome in foot and ankle arthrodesis?

Stegeman, Mark, van Ginneken, Berbke To, Boetes, Bastiaan, Tuinhout, Mirjam, Louwerens, Jan Willem, Swierstra, Bartele

Journal:

BMC Musculoskeletal Disorders

Year:

2014

Language:

english

File:

PDF, 168 KB

english, 2014

20

[IEEE 2002 IEEE International Ultrasonics Symposium - Munich, Germany (8-11 Oct. 2002)] 2002 IEEE Ultrasonics Symposium, 2002. Proceedings. - Combined acoustic-electromagnetic simulation of thin-film bulk acoustic wave filters

Milsom, R.F., Lobl, H.-P., Peligrad, D.N., Lobeek, J.-W., Tuinhout, A., ten Dolle, R.H.

Year:

2002

Language:

english

File:

PDF, 120 KB

english, 2002

21

[IEEE ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures - Monterey, CA, USA (13-16 March 2000)] ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) - Characterisation of systematic MOSFET transconductance mismatch

Year:

2000

Language:

english

File:

PDF, 580 KB

english, 2000

22

[IEEE 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS) - Edinburgh, UK (2008.03.24-2008.03.27)] 2008 IEEE International Conference on Microelectronic Test Structures - Influence of STI stress on drain current matching in advanced CMOS

Wils, Nicole, Tuinhout, Hans, Meijer, Maurice

Year:

2008

Language:

english

File:

PDF, 601 KB

english, 2008

23

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch

Tuinhout, H.P., Bretveld, A., Peters, W.C.M.

Year:

2003

Language:

english

File:

PDF, 461 KB

english, 2003

24

[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Test structures for investigation of metal coverage effects on MOSFET matching

Tuinhout, H.P., Vertregt, M.

Year:

1997

Language:

english

File:

PDF, 640 KB

english, 1997

25

Characterization of systematic MOSFET current factor mismatch caused by metal CMP dummy structures

Tuinhout, H.P., Vertregt, M.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2001

Language:

english

File:

PDF, 273 KB

english, 2001

26

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - CMOS device optimization for mixed-signal technologies

Stolk, P.A., Tuinhout, H.P., Duffy, R., Augendre, E., Bellefroid, L.P., Bolt, M.J.B., Croon, J., Dachs, C.J.J., Huisman, F.R.J., Moonen, A.J., Ponomarev, Y.V., Roes, R.F.M., Da Rold, M., Seevinck, E.,

Year:

2001

Language:

english

File:

PDF, 414 KB

english, 2001

27

[IEEE Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Portland, OR (2002.09.30-2002.09.30)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat No 03CH37440) BIPOL-03 - Improving BiCMOS technologies using BJT parametric mismatch characterisation

Year:

2003

Language:

english

File:

PDF, 853 KB

english, 2003

28

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Methodology to evaluate long channel matching deterioration and effects of transistor segmentation on MOSFET matching

Tuinhout, Hans, Wils, Nicole, Meijer, Maurice, Andricciola, Pietro

Year:

2010

Language:

english

File:

PDF, 220 KB

english, 2010

29

[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Impact of ion implantation statistics on V/sub T/ fluctuations in MOSFETs: comparison between decaborane and boron channel implants

Tuinhout, H., Widdershoven, F., Stolk, P., Schmitz, J., Dirks, B., van der Tak, K., Bancken, P., Politiek, J.

Year:

2000

Language:

english

File:

PDF, 216 KB

english, 2000

30

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Influence of metal coverage on transistor mismatch and variability in copper damascene based CMOS technologies

Wils, Nicole, Tuinhout, Hans, Meijer, Maurice

Year:

2010

Language:

english

File:

PDF, 150 KB

english, 2010

31

[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Effects of metal coverage on MOSFET matching

Tuinhout, H., Pelgrom, M., Penning de Vries, R., Vertregt, M.

Year:

1996

Language:

english

File:

PDF, 424 KB

english, 1996

32

[IEEE 2002 IEEE International Ultrasonics Symposium - Munich, Germany (8-11 Oct. 2002)] 2002 IEEE Ultrasonics Symposium, 2002. Proceedings. - Solidly mounted bulk acoustic wave filters for the GHz frequency range

Loebl, H.P., Metzmacher, C., Peligrad, D.N., Mauczok, R., Klee, M., Brand, W., Milsorn, R.F., Lok, P., Van Straten, R., Tuinhout, A., Lobeek, J.W.

Year:

2002

Language:

english

File:

PDF, 138 KB

english, 2002

33

[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ, USA (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - Design and evaluation of an integrated thin film resistor matching test structure

Tuinhout, Hans, Wils, Nicole, Huiskamp, Paul, de Koning, Eelco

Year:

2015

Language:

english

File:

PDF, 1.37 MB

english, 2015

34

[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Comparison of Mode-Conversion, Energy-Trapping and Lateral Acoustic Coupling in FBAR and SBAR

Milsom, R., Loebl, H.-P., Vanhelmont, F., Jansman, A., Lobeek, J.-W., Tuinhout, A.

Year:

2005

Language:

english

File:

PDF, 356 KB

english, 2005

35

Solidly Mounted Bulk Acoustic Wave Filters

Loebl, H. P., Metzmacher, C., Milsom, R. F., Tuinhout, A., Lok, P., van Straten, F.

Journal:

MRS Proceedings

Year:

2003

Language:

english

File:

PDF, 1.34 MB

english, 2003

36

[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Design and use of an array-based test structure to characterize mechanical stress effects caused by WLCSP solder bumps

Tuinhout, Hans, van Dalen, Rob

Year:

2016

Language:

english

File:

PDF, 42.70 MB

english, 2016

37

Fabrication of 100 nm polysilicon-emitter transistors using e-beam lithography

M.N. Webster, A. Tuinhout, A.H. Verbruggen, J. Romijn, S. Radelaar, B. Lo¨chel, H.F.F. Jos, P.M.A. Moors

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 862 KB

english, 1995

38

Metallization of submicron microwave bipolar transistors by electroplating

M.N. Webster, A. Tuinhout, B. Löchel, A.H. Verbruggen, J. Romijn, E. van der Drift, S. Radelaar, H.F.F. Jos, P.M.A. Moors

Journal:

Microelectronic Engineering

Year:

1994

Language:

english

File:

PDF, 362 KB

english, 1994

39

Performance dependence of large-area silicon p-i-n photodetectors upon epitaxial thickness

M Seto, M Mabesoone, S De Jager, A Vermeulen, W De Boer, M Theunissen, H Tuinhout

Journal:

Solid-State Electronics

Year:

1997

Language:

english

File:

PDF, 416 KB

english, 1997

40

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Measurement of lithographical proximity effects on matching of bipolar transistors

Tuinhout, H.P., Peters, W.C.M.

Year:

1998

Language:

english

File:

PDF, 1.24 MB

english, 1998

41

Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region

Magnone, P., Crupi, F., Wils, N., Tuinhout, H. P., Fiegna, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 866 KB

english, 2012

42

FinFET Mismatch in Subthreshold Region: Theory and Experiments

Magnone, P., Crupi, F., Mercha, A., Andricciola, P., Tuinhout, H., Lander, R.J.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2010

Language:

english

File:

PDF, 390 KB

english, 2010

43

Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

Magnone, P., Crupi, F., Wils, N., Jain, R., Tuinhout, H., Andricciola, P., Giusi, G., Fiegna, C.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 463 KB

english, 2011

44

[IEEE 2004 IEEE International Solid-State Circuits Conference - San Francisco, CA, USA (15-19 Feb. 2004)] 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) - Designing outside rail constraints

Annema, A.J., Nautal, B., van Langevelde, R., Tuinhout, H.

Year:

2004

Language:

english

File:

PDF, 485 KB

english, 2004

45

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - A comparison of extraction techniques for threshold voltage mismatch

Croon, J.A., Tuinhout, H.P., Difrenza, R., Knol, J., Moonen, A.J., Decoutere, S., Maes, H.E., Sansen, W.

Year:

2002

Language:

english

File:

PDF, 448 KB

english, 2002

46

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Experimental assessment of self-heating in SOI FinFETs

Scholten, A.J., Smit, G.D.J., Pijper, R.M.T., Tiemeijer, L.F., Tuinhout, H.P., van der Steen, J.-L.P.J., Mercha, A., Braccioli, M., Klaassen, D.B.M.

Year:

2009

Language:

english

File:

PDF, 181 KB

english, 2009

47

Wils, Nicole, Tuinhout, Hans P., Meijer, Maurice

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2009

Language:

english

File:

PDF, 1.49 MB

english, 2009

48

[IEEE ICMTS 2002. 2002 International Conference on Microelectronic Test Structures - Cork, Ireland (8-11 April 2002)] Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. - Design and characterisation of a high precision resistor ladder test structure

Tuinhout, H.P., Hoogzaad, G., Vertregt, M., Roovers, R.L.J., Erdmann, C.

Year:

2002

Language:

english

File:

PDF, 437 KB

english, 2002

49

[IEEE IEEE International Conference on Microelectronic Test Structures - Long Beach, CA (February 22-23, 1988)] Proceedings of the IEEE International Conference on Microelectronic Test Structures - A Fully Analytical MOSFET Model Parameter Extraction Approach

Tuinhout, H.P., Swaving, S., Joosten, J.J.M.

Year:

1988

Language:

english

File:

PDF, 557 KB

english, 1988

50

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - A new technique for characterizing very low frequency noise of bipolar junction transistors

Tuinhout, Hans, Zegers-van Duijnhoven, Adrie, Mertens, Hans, Heringa, Anco

Year:

2011

Language:

english

File:

PDF, 1.14 MB

english, 2011